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LI Dengdiao, YUAN Kaipu, ZHOU Qindi. Development of a Fault Location Device for Upstream Tripping Caused by Low-voltage LeakageJ. RURAL ELECTRIFICATION, 2026, (6): 84-88. DOI: 10.13882/j.cnki.ncdqh.2601A046
Citation: LI Dengdiao, YUAN Kaipu, ZHOU Qindi. Development of a Fault Location Device for Upstream Tripping Caused by Low-voltage LeakageJ. RURAL ELECTRIFICATION, 2026, (6): 84-88. DOI: 10.13882/j.cnki.ncdqh.2601A046

Development of a Fault Location Device for Upstream Tripping Caused by Low-voltage Leakage

  • To address the low efficiency of low-voltage leakage location, this paper develops a fault location device for upstream tripping caused by low-voltage leakage, which is specifically designed to prevent frequent power outages caused by leakage in meter boxes. By integrating low-voltage AC magnetic power tapping connectors, multiple voltage and current monitoring units, intelligent algorithms, and a micro application system, the device realizes accurate monitoring and rapid location of leakage faults. It features convenient installation, safe operation, continuous data acquisition, and fast response, thereby accelerating fault reporting and repair response and improving customer satisfaction. The device has significant technical advantages and practical value.
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