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ZHANG Fanbin, MA Lifang, ZHU Dandan, WANG Quan. The Analysis of a Developmental Ground Short Circuit Fault in a 10 kV Double-circuit Lines on the Same Tower[J]. RURAL ELECTRIFICATION, 2024, (12): 70-72. DOI: 10.13882/j.cnki.ncdqh.2405A033
Citation: ZHANG Fanbin, MA Lifang, ZHU Dandan, WANG Quan. The Analysis of a Developmental Ground Short Circuit Fault in a 10 kV Double-circuit Lines on the Same Tower[J]. RURAL ELECTRIFICATION, 2024, (12): 70-72. DOI: 10.13882/j.cnki.ncdqh.2405A033

The Analysis of a Developmental Ground Short Circuit Fault in a 10 kV Double-circuit Lines on the Same Tower

  • Taking a single-circuit line ground fault of a 10 kV double-circuit lines on the same tower developing into a double-circuit lines interphase ground fault and leading to line break as an example, the electrical characteristics of ground fault are analyzed theoretically. Combined with the analysis of wave recording data and on-site investigation data, the fault evolution process and causes of fault development are deduced, and suggestions are put forward from the aspects of developmental ground fault.
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